Wavelength range

Standard model (SolidSpec-3700)
240 to 2600 nm (with standard integrating sphere)
190 to 3300 nm (when optional direct detection unit)
DUV model (SolidSpec-3700DUV)
175 to 2600nm (with standard integrating sphere)
165 to 3300 nm (with optional direct detection unit DUV)

Spectral band width

UV/VIS region: 0.1, 0.2, 0.5, 1, 2, 3, 5, 8 nm (8 steps)
NIR region: 0.2, 0.5, 1, 2, 3, 5, 8, 12, 20, 32 nm (10 steps)

Resolution Note 1

0.1 nm

Wavelength Sampling

0.01 to 2 nm increments

Wavelength accuracy Note 1

±0.2 nm in UV-VIS region, ±0.8 nm in NIR region

Wavelength repeatability Note 1

within ±0.08 nm in UV-VIS region, ±0.32 nm in NIR region

Wavelength scanning speed

When moving between wavelengths:
5000 nm/min in UV-VIS region, 20000 nm/min in NIR region
When scanning wavelengths:
Max. 3600 nm/min in PMT or InGaAs region, max. 1600 nm/min in PbS region

Light source switching

The light sources are switched automatically in conjuction with wavelength scanning. The wavelength at which the light sources are switched can be freely set in a range of 282 to 393 nm in 0.1 nm increments.

Stray light Note 1

Max. 0.00008% (220 nm, NaI)
Max. 0.00005% (340 nm, NaNO2)
Max. 0.0005% (1420 nm, H2O)
Max. 0.005% (2365 nm, CHCl3)

Photometric system

Double-beam, direct ratio measuring system

Photometric range

-6 to 6 Abs

Photometric accuracy

±0.003 Abs (1 Abs), ±0.002 Abs (0.5 Abs) determined with NIST930D standard filter

Photometric repeatability

0.001 Abs (0 to 0.5 Abs), 0.002 Abs (0.5 to 1 Abs) determined under conditions of 1 second accumulation and maximum deviation for five times measurements.

Photometric Noise

Under 0.0002Abs(500nm,SBW 8nm), 0.00005(1500nm,SBW 8nm)
When using Direct Detection unit; Under 0.00005Abs(500nm,SBW 2nm), 0.00008Abs(900nm, SBW 2nm) 0.00003Abs(1500nm,SBW 2nm)
Determined under condition of RMS value at 0Abs and 1 second integration.

Baseline flatness

±0.003 Abs (240 to 350 nm at spectral band width of 8 nm)
±0.002 Abs (350 to 1600 nm at spectral band width of 8 nm in VIS region and 20 nm in NIR region)
±0.004 Abs (1600 to 2600 nm at spectral band width of 20 nm)

Drift

SolidSpec-3700: within 0.0002 Abs/h (after 2 hour warm-up, 500nm, 1-second accumulation)
SolidSpec-3700DUV: Max. 0.0003 Abs/h (after 2 hour warm-up, 500 nm, 1-second accumulation)

Light source

50W halogen lamp (2000hours life), deuterium lamp (socket-type with 1250hours life for SolidSpec-3700 300hours for SolidSpec-3700DUV)
Automatic position alignment is used for maximum sensitivity.

Monochromator

Grating-grating type monochromator
Pre-monochromator: Concave diffraction grating monochromator  
Main monochromator: High performance blazed holographic grating in aberration-corrected Czerny-Turner mounting

Detectors

UV-VIS region: Photomultiplier R-928 (SolidSpec-3700), R-955 (SolidSpec-3700DUV)
NIR region: InGaAs and cooled PbS

Sample compartment

Inside dimensions: 900W x 700D x 350H (mm),
Maximum sample size: 700W x 560D x 40H (mm)

Dimensions

1000W x 800D x 1200H (mm) (not include the protruding portions)

Weight

170 Kg

Ambient temperature

15 to 35°C

Ambient humidity

35 to 80% (no condensation, 70% or less at temperatures of 30°C or more)

Power requirements

AC 100V, 120V, 220V, 230V, 240V, 50/60Hz

Power consumption

300VA